Serial section electron microscopy (ssEM) is a pivotal technique for investigating neuronal connections and brain microstructures. However, imperfect sample preparation and image acquisition often lead to degradation, posing challenges for subsequent analysis. While previous deep learning methods, such as the interpolation model using spatially adaptive convolutions, have been proven to outperform conventional approaches, they struggle to recover high-frequency details, resulting in poor perceptual quality and segmentation performance. This study presents a novel approach leveraging diffusion models to restore missing slices of ssEM images. To accommodate the anisotropic characteristic of ssEM images, we enhance the backbone network with asymmetric and symmetric 3D convolutions. Additionally, we propose the Adaptive and Learnable Reconstruction (ALR) module with the First and Last slices Attention Block (FLAB) for effective feature extraction. A Multi-output Joint Strategy (MJS) is utilized for noise estimation, reducing training-testing discrepancies and achieving diffusion correction. Moreover, we also redesign the inference process to optimize the restoration of partially damaged slices, enabling restoration without additional artifact simulation or retraining. Experiment results demonstrate the effectiveness of our approach in generating more realistic slices and its superior performance in downstream tasks, surpassing previous methods.